4.3 Nanoscale Samples and Optics

Project coordinators: W. Engel

T2: Optical elements for XUV and soft x-rays

Gratings and Fresnel zone plates

We fabricate individual oprical elements tailored to particular experiments. One example are curved gratings tailored for single-shot fluence mapping at x-ray free electron lasers.

Masks for imaging via x-ray holography

Focused Ion Beam (FIB) modification is used to fabricate tailored object and reference apertures in a gold film as a near field mask for Fourier transform x-ray holography.

Modification of various substrate types for imaging and spectroscopy

Our back-thinning method allows preparation of thin film samples grown on bulk substrates. This enable for instance XUV transmission studies of epitaxially grown thin films.

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