4.3 Nanoscale Samples and Optics
Project coordinators: W. EngelT2: Optical elements for XUV and soft x-rays
Gratings and Fresnel zone plates
We fabricate individual oprical elements tailored to particular experiments. One example are curved gratings tailored for single-shot fluence mapping at x-ray free electron lasers.
Masks for imaging via x-ray holography
Focused Ion Beam (FIB) modification is used to fabricate tailored object and reference apertures in a gold film as a near field mask for Fourier transform x-ray holography.
Modification of various substrate types for imaging and spectroscopy
Our back-thinning method allows preparation of thin film samples grown on bulk substrates. This enable for instance XUV transmission studies of epitaxially grown thin films.