MBI Publications

1. Origin of yellow emissions from (In,Ga,Al)N based 450 nm emitting diode lasers

   R. Kernke, H. Wang, J. Hong, F. Yue, J. Chu, J. W. Tomm

   OSA Continuum 2 (2019) 1496-1501
2. By-emitter analysis of 450-nm emitting high-power diode laser bars

   F. Mahler, R. Kernke, J. W. Tomm, H. König, B. Stojetz, M. Ali, A. Lell

   IEEE Journal of Selected Topics in Quantum Electronics 25 (2019) 1500506/1-6
3. Visible and near-infrared emission images of (In,Ga,Al)N-based 450 nm emitting diode laser

   J. W. Tomm, R. Kernke, M. Ali, B. Stojetz, A. Lell, H. König

   SPIE Proceedings Series 10939 (2019) 109390J/1-12
4. Chip-carrier thermal barrier and its impact on lateral thermal lens profile and beam parameter product in high power broad area lasers

   J. Rieprich, M. Winterfeldt, R. Kernke, J. W. Tomm, P. Crump

   Journal of Applied Physics 123 (2018) 125703/1-11
5. Defect evolution during catastrophic optical damage in 450-nm emitting InGaN/GaN diode lasers

   J. W. Tomm, R. Kernke, A. Löffler, B. Stojetz, A. Lell, H. König

   SPIE Proceedings Series 10553 (2018) 1055308/1-7
6. Catastrophic optical damage of GaN-based diode lasers: sequence of events, damage pattern, and comparison with GaAs-based devices

   J. W. Tomm, R. Kernke, G. Mura, M. Vanzi, M. Hempel, B. Acklin

   Journal of Electronic Materials 47 (2018) 4959-4963
7. Assessment of factors regulating the thermal lens profile and lateral brightness in high power diode lasers

   J. Rieprich, M. Winterfeldt, J. W. Tomm, R. Kernke, P. Crump

   SPIE Proceedings Series 10085 (2017) 1008502/1-10
8. Shortwave infrared (SWIR) emission from 450 nm InGaN diode lasers

   R. Kernke, M. Hempel, J. W. Tomm, T. Elsaesser, B. Stojetz, H. König, U. Strauß

   Optical Materials Express 6 (2016) 2139-2146
9. Assessing the influence of the vertical epitaxial layer design on the lateral beam quality of high-power broad area diode lasers

   M. Winterfeldt , J. Rieprich, S. Knigge, A. Maaßdorf, M. Hempel, R. Kernke, J. W. Tomm, G. Erbert, P. Crump

   SPIE Proceedings Series 9733 (2016) 97330O/1-9

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