MBI Publications

1. Micro-thermography enables rapid inspection of defects in diode lasers

   A. Kozlowska, J. W. Tomm, P. Wawrzyniak, F. Weik

   The International Society for Optical Engineering - SPIE Newsroom (2006) 1-2
2. Reliability screening of diode lasers by multispectral infrared imaging

   A. Kozlowska, P. Wawrzyniak, A. Malag, M. Teodorczyk, J.W. Tomm, F. Weik

   Journal of Applied Physics 99 (2006) 053101/1-6
3. Studies of the degradation mechanisms in high-power diode lasers using multi-channel micro-thermography

   A. Kozlowska, J.W. Tomm, P. Wawrzyniak, A. Malag, F. Weik, M. Latoszek

   SPIE Proceedings 5958 (2005) 223-229
4. Deep level emission from high-power diode laser bars detected by multispectral infrared imaging

   A. Kozlowska, P. Wawrzyniak, J.W. Tomm, F. Weik, T. Elsaesser

   Applied Physics Letters 87 (2005) 153503/1-3
5. Thermal properties of high-power diode lasers investigated by micro-thermography

   A. Kozlowska, F. Weik, J.W. Tomm, A. Malag, M. Latoszek, P. Wawrzyniak, M. Teodorczyk, L Dobrzanski, M. Zbroszczyk, M. Bugajski

   SPIE Proceedings 5711 (2005) 158-165
6. Screening techniques for high power GaAsP/AlGaAs/GaAs semiconductor lasers

   P. Wawrzyniak, A. Kozlowska, J.W. Tomm, A. Malag, F. Weik, M. Teodorczyk, M. Latoszek

   SPIE Proceedings 5958 (2005) 59582K/1-7

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