MBI Publications

1. Thermal processes in high-power laser bars investigated by spatially resolved thermoreflectance

   D. Pierscinska, A. Kozlowska, K. Pierscinski, M. Bugajski, J. W. Tomm, M. Ziegler, F. Weik

   Journal of Materials Science: Materials in Electronics 19 (2008) S150-S154
2. Tailoring of optical mode profiles of high-power diode lasers evidenced by near-field photocurrent spectroscopy

   A. Kozlowska, M. Szymanski, E. Pruszynska-Karbownik, M. Bugajski, R. Pomraenke, C. Lienau, J. Renard, A. Malag

   Applied Physics Letters 91 (2007) 101103/1-3
3. Transient thermal properties of high-power diode laser bars

   M. Ziegler, F. Weik, J. W. Tomm, T. Elsaesser, W. Nakwaski, R. P. Sarzala, D. Lorenzen, J. Meusel, A. Kozlowska

   Applied Physics Letters 89 (2006) 263506/1-3
4. Complementary thermo-reflectance and micro-Raman analysis of facet temperatures of diode lasers

   T. J. Ochalski, D. Pierscinska, K. Pierscinski, M. Bugajski, J. W. Tomm, T. Grunske, A. Kozlowska

   Applied Physics Letters 89 (2006) 071104/1-3
5. Spatially-resolved and temperature dependent thermal tuning rates of high-power diode laser arrays

   M. Kreissl, T.Q. Tien, J.W. Tomm, D. Lorenzen, A. Kozlowska, M. Latoszek, M. Oudart, J. Nagle

   Applied Physics Letters 88 (2006) 133510/1-3
6. Reliability screening of diode lasers by multispectral infrared imaging

   A. Kozlowska, P. Wawrzyniak, A. Malag, M. Teodorczyk, J.W. Tomm, F. Weik

   Journal of Applied Physics 99 (2006) 053101/1-6
7. Micro-thermography enables rapid inspection of defects in diode lasers

   A. Kozlowska, J. W. Tomm, P. Wawrzyniak, F. Weik

   The International Society for Optical Engineering - SPIE Newsroom (2006) 1-2
8. Microthermographic investigations of aging processes in diode lasers

   A. Kozlowska, J. W. Tomm, A. Malag

   SPIE Proceedings 6368 (2006) 63680B/1-7
9. Near-field spectroscopic analysis of the mode structure in high-power diode lasers based on a double barrier separate confinement heterostructure

   A. Kozlowska, A. Malag, R. Pomraenke, J. Renard, C. Lienau

   SPIE Proceedings 6368 (2006) 63680X/1-9
10. Analysis of thermal images from diode lasers: Temperature profiling and reliability screening

    A. Kozlowska, M. Latoszek, J.W. Tomm, F. Weik, T. Elsaesser, M. Zbroszczyk, M. Bugajski, B. Spellenberg, M. Bassler

    Applied Physics Letters 86 (2005) 203503/1-3

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