MBI Staff Member – Personal info

Asmus Richter

No longer employed at MBI

MBI Publications

  1. Near-field optical-beam-induced current spectroscopy as tool for analyzing aging processes in diode lasers

    J.W. Tomm, A. Richter, C. Lienau, T. Elsaesser, J. Luft

    SPIE Proceedings 3001 (1997) 29-38
  2. Vacuum near-field scanning optical microscope for variable cryogenic temperatures

    G. Behme, A. Richter, M. Sueptitz, C. Lienau

    Rev. Sci. Instrum. 68 (1997) 3458-3463
  3. Near-field photocurrent spectroscopy: A novel technique for studying defects and aging in high-power semiconductor lasers (invited paper)

    C. Lienau, A. Richter, J.W. Tomm

    Applied Physics A 64 (1997) 341-351
  4. Carrier transport and capture into single GaAs quantum wires studied by near-field optical spectroscopy

    A. Richter, G. Behme, M. Sueptitz, C. Lienau, T. Elsaesser, R. Nötzel, M. Ramsteiner, K. Ploog

    Phys. Sol. Stat. (b) 204 (1997) 247-250
  5. Waveguide effect on the image formation process in near-field photocurrent spectroscopy of semiconductor laser diodes

    A. Richter, C. Lienau, J.W. Tomm

    Surf. & Interf. Analysis 25 (1997) 573-582
  6. Near-field optical spectroscopy of single GaAs quantum wires

    A. Richter, M. Sueptitz, C. Lienau, T. Elsaesser, M. Ramsteiner, R. Nötzel, K.H. Ploog

    Surf. & Interf. Analysis 25 (1997) 583-592
  7. Real-space transfer and trapping of carriers into single GaAs quantum wires studied by near-field optical spectroscopy

    A. Richter, M. Sueptitz, C. Lienau, T. Elsaesser, M. Ramsteiner, R. Nötzel, K.H. Ploog

    Phys. Rev. Lett. 79 (1997) 2145-2148
  8. Light-induced expansion of fiber tips in near-field scanning optical microscopy

    C. Lienau, A. Richter, T. Elsaesser

    Appl. Phys. Lett. 69 (1996) 325-327
  9. Near-field scanning optical microscopy of polarization bistable laser diodes

    Ch. Lienau, A. Richter, A. Klehr, T. Elsaesser

    Appl. Phys. Lett. 69 (1996) 2471-2473
  10. Optical near-field photocurrent spectroscopy - a new technique for analyzing microscopic aging processes in optoelectronic devices

    A. Richter, J.W. Tomm, C. Lienau, J. Luft

    Appl. Phys. Lett. 69 (1996) 3981-3983