Tue, 01.10.2024  |  10:00
Room: seminar room A, house A, room 2.01

Soft x-ray scatterometry for semiconductor metrology

Dr. Peter Smorenburg | ASML Research, The Netherlands

With the breakthrough of EUV lithography, the spatial scale in semiconductor manufacturing has decreased to well below the resolution limits of…
Wed, 02.10.2024  |  14:00
Room: Max Born Hall
MBI Colloquium

TBA

Prof. Francesca Calegari | Center for Free-Electron Laser Science (CFEL), DESY Hamburg