Wed, 01.12.2021  |  14:00
virtual, via Zoom link

Fast electrons and hard X-rays for unraveling charge carrier dynamics

Prof. Renske van der Veen | Helmholtz Zentrum Berlin and University of Illinois Urbana-Champaign, USA

talks about

The visualization and tracking of light-induced carrier and atomic dynamics on their inherent ultrafast time scales is of uttermost importance in a large range of fields, including photocatalysis, photovoltaics, optoelectronics, and plasma physics. Conventional characterization techniques either lack the spatial resolution necessary to resolve individual atoms, or they lack the temporal resolution required to capture the dynamics as they evolve. Our group develops and uses complementary X-ray and electron-based tools to visualize light-induced processes on atomic length and time scales.  In this talk I will present our recent results on using transient X-ray linear dichroism to study carrier screening in heterostructured nanomaterials for solar energy applications, as well as using ultrafast electron microscopy to visualize the transient lensing from a photoemitted electron gas.

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